{"id":17895,"date":"2016-10-20T10:16:41","date_gmt":"2016-10-20T09:16:41","guid":{"rendered":"http:\/\/dev.test-probe.jp\/?p=17895"},"modified":"2022-08-03T10:17:06","modified_gmt":"2022-08-03T09:17:06","slug":"tespro-will-participate-in-the-electrotest-japan-exhibition-in-2017","status":"publish","type":"post","link":"https:\/\/test-probe.jp\/en\/tespro-will-participate-in-the-electrotest-japan-exhibition-in-2017\/","title":{"rendered":"TESPRO will participate in the ELECTROTEST JAPAN exhibition in 2017."},"content":{"rendered":"<p>TESPRO will participate in the\u00a0<a href=\"http:\/\/www.nepconjapan.jp\/en\/About\/ELECTROTEST_JAPAN\/\">ELECTROTEST JAPAN<\/a>\u00a0exhibition\u00a0in 2017.<\/p>\n<p>&nbsp;<\/p>\n<div>\n<div>Dates\uff1aJanuary 18 (Wednesday) \uff5e 20 (Friday)<br \/>\n10\uff1a00\uff5e18\uff1a00\uff0817\uff1a00 on Friday\uff09<\/div>\n<div><\/div>\n<div>Our booth:E-18-10<\/div>\n<div>Place\uff1aTokyo Big Sight<\/div>\n<div><\/div>\n<div>We look forward to your visit.<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p>TESPRO will participate in the\u00a0ELECTROTEST JAPAN\u00a0exhibition\u00a0in 2017. &nbsp; Dates\uff1aJanuary 18 (Wednesday) \uff5e 20 (Friday) 10\uff1a00\uff5e18\uff1a00\uff0817\uff1a00 on Friday\uff09 Our booth:E-18-10 Place\uff1aTokyo Big Sight We look forward to your visit.<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[64],"tags":[],"class_list":["post-17895","post","type-post","status-publish","format-standard","hentry","category-news"],"acf":[],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/posts\/17895","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/comments?post=17895"}],"version-history":[{"count":0,"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/posts\/17895\/revisions"}],"wp:attachment":[{"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/media?parent=17895"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/categories?post=17895"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/tags?post=17895"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}