{"id":31667,"date":"2024-01-05T00:50:22","date_gmt":"2024-01-05T00:50:22","guid":{"rendered":"https:\/\/test-probe.jp\/?p=31667"},"modified":"2024-01-05T00:50:22","modified_gmt":"2024-01-05T00:50:22","slug":"nepcon-japan-2024","status":"publish","type":"post","link":"https:\/\/test-probe.jp\/en\/nepcon-japan-2024\/","title":{"rendered":"TESPRO will participate in NEPCON JAPAN 2024"},"content":{"rendered":"<p>Happy New Year! We wish you every success in this year.<\/p>\n<p>&nbsp;<\/p>\n<p>TESPRO will participate in NEPCON JAPAN 2024.<\/p>\n<p>&nbsp;<\/p>\n<p>From semiconductor package testing to high current battery testing,<\/p>\n<p>Many product samples will be on display.<\/p>\n<p>We look forward to seeing you.<\/p>\n<p>&nbsp;<\/p>\n<p>Date :\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0January 24 (Wed) &#8211; 26 (Fri) , 2024<\/p>\n<p>Location :\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 Tokyo Big Sight<\/p>\n<p>Our booth number :\u00a0 \u00a0 East Hall 2 Booth E15-37 (Electro Test Japan ZONE)<\/p>\n<p>&nbsp;<\/p>\n<p>We welcome your appointment in advance. We will book a meeting slot for you.<\/p>\n<p>&nbsp;<\/p>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-31663 size-large\" src=\"https:\/\/test-probe.jp\/wp-content\/uploads\/2024\/01\/inw_jp_24_img_press_logodl_01.jpg.coredownload.752270647-1024x253.jpg\" alt=\"\" width=\"1024\" height=\"253\" srcset=\"https:\/\/test-probe.jp\/wp-content\/uploads\/2024\/01\/inw_jp_24_img_press_logodl_01.jpg.coredownload.752270647-1024x253.jpg 1024w, https:\/\/test-probe.jp\/wp-content\/uploads\/2024\/01\/inw_jp_24_img_press_logodl_01.jpg.coredownload.752270647-300x74.jpg 300w, https:\/\/test-probe.jp\/wp-content\/uploads\/2024\/01\/inw_jp_24_img_press_logodl_01.jpg.coredownload.752270647-768x190.jpg 768w, https:\/\/test-probe.jp\/wp-content\/uploads\/2024\/01\/inw_jp_24_img_press_logodl_01.jpg.coredownload.752270647.jpg 1443w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Happy New Year! We wish you every success in this year. &nbsp; TESPRO will participate in NEPCON JAPAN 2024. &nbsp; From semiconductor package testing to high current battery testing, Many product samples will be on display. We look forward to seeing you. &nbsp; Date :\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[64],"tags":[],"class_list":["post-31667","post","type-post","status-publish","format-standard","hentry","category-news"],"acf":[],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/posts\/31667","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/comments?post=31667"}],"version-history":[{"count":0,"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/posts\/31667\/revisions"}],"wp:attachment":[{"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/media?parent=31667"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/categories?post=31667"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/test-probe.jp\/en\/wp-json\/wp\/v2\/tags?post=31667"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}