High Current Probes For Semiconductor Inspection

High Current Probes For Semiconductor Inspection

0.5mm pitch / maximum 7A  double-ended probes

List of high current probe standards for semiconductor inspection

Barrel outline

Minimum pitch

Load @
recommended stroke

Full length

Barrel length

Operating Temperature

DW-038HS/R-10C

0.38mm

0.50mm

38.0g@0.65mm

8.00mm

6.30mm

-100~+300℃

DW-038R/R-10C

0.38mm

0.50mm

38.0g@0.65mm

8.00mm

6.30mm

-100~+300℃