Kelvin Semiconductor Probes

Kelvin Semiconductor Probes

Four-terminal probes with a barrel diameter of Φ0.18 to 0.20 for semiconductor device test mainly used for IC sockets. Used as a set of two.

One-end movable list for 4-terminal method inspection

Barrel outer
diameter

Load @
recommended stroke

Full length

Barrel length

KDS-018K/R-01

0.18mm

14.0g@0.35mm

3.60mm

2.60mm

KDS-020K/R-01

0.20mm

17.5g@0.30mm

3.00mm

1.90mm