This tool is used to insert and remove a nut for fixing the barrel of OSPH-3, OSPH-5, OSPH-8, KLOSPH-3, KLOSPH-5, and KLOSPH-8 series probes.
Because the outer diameter of the bit is small, probes can be arranged at a narrow pitch.
SMP-Male用
周波数:18GHz
H-MTD Female用
周波数:14 GHz
短納期、低価格、高品質。
HF830, HF86の信号用内部接点の交換用プローブです。
ライトプローブとセンサーは、セットでご購入下さい。(単品ではご使用できません。)
U.FL用
周波数:8GHz
SWJ用
周波数:6.5 GHz
Fakra-Male用
周波数:6.0GHz
HSD-Female用
周波数:1GHz
HSD-Female用
周波数:1GHz
SMC-Male 用
周波数:5.0GHz
SMB-Male用
周波数:6.0GHz
SMB-Male用
周波数:5.0GHz
Mini SMP-Male用
周波数: 12.0GHz
MMPX-Female用
周波数: 12.0GHz
GT13-Male用
周波数:1.0GHz
BNC-Female用
周波数:6.0GHz
HSD-Male用
周波数:3GHz
HFM-Female(4-pole)用
周波数:12GHz
HFM-Female用
周波数:12GHz
Fakra-Male用
周波数:6.0GHz
Fakra-Female用
周波数: 6.0GHz
Fakra-Female用
周波数: 6.0GHz
H-MTD Male (4-pole) 用
周波数:14GHz
H-MTD Male (2-pole) 用
周波数:14GHz
H-MTD Male 用
周波数:14GHz
A fully non-magnetic double-ended probes with a barrel diameter of Φ0.26 to φ0.58. Permeability μ<1.01.
Double-ended probes with a barrel diameter of Φ0.26 to φ0.58. Temperature range of -100 to + 300 ° C.
All stoppered receptacles (with collar or upper press ring) can be inserted with the FEWZ -… E0 tool. Tool guide pins help stabilize the receptacle and set it in the optimum position.
The hook wrench is a standard tool that can be used with all probes with a probe tip diameter larger than the square wrench size.
LED tool to adjust the optimum switch point of the switch probe
The switch probe can be placed in the correct position with the tool FWZ… SA before the final electrical connection. An integrated LED signal that lights up as soon as the switch circuit closes allows you to adjust the exact switching position.
Gold-plated metal wires are arranged at equal intervals in silicone rubber.
Suitable for semiconductor inspection such as BGA, LGA, QFP, QFN.
The Matrix series has excellent high frequency transfer characteristics due to its short conduction path, and its repeatability is greatly improved compared to general elastomer connectors. It is used for inspection of RF devices such as semiconductors from CPUs to high frequency filters.
Spring force gauge
FK50
The spring force gauge can measure the load of all types of spring contact probes up to 50N. If there is no problem on the probe side, you can check and determine the spring load very easily with this machine. The measurement results are displayed on the unit, and the display can be electrically rotated 180 ° if desired (for example, for measuring overhead applications).
Simply place the sleeve you want to measure on the probe and push it into the mounting plate to measure.
The depth of the sleeve can be adjusted by the projection height of the probe.
Adjustable measuring sleeves are available in 3 different diameters.
Receptacle removal tool
FZWZ-SET-001
You can remove the mounted receptacle without damaging the drill hole.
Can also be used for broken receptacles.
It can be removed even under conditions where it cannot be removed by hitting it to the back of the board / block.
Metal particle contacts are arranged in silicon rubber. Suitable for semiconductor test of gold-plated flat pads such as QFN and LGA.